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Engineering Physics

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Surface films influence on the electric and heat conductances of metal contacts
A.G. Vikulov, D.G. Vikulov

The electric and heat conductances of semiconductor films in metal contacts are considered. The interface zonal structure and the mechanism of the potential barrier formation by different ratios of the electron work functions in metal and semiconductor are investigated. The expressions of the electric and heat resistances of the semiconductor nanofilms electronic conduction are gave. The resistances dependence on the barrier, the temperature, the dielectric properties and the films thickness is studied. The possibility to measure the films thickness in symmetric metal contacts is shown. The method of the metal interfaces electronic conductance regulation with based on semiconductor nanofilms multilayer structures is described. Key words: metals, semiconductors, thin films, electronic transport in interface structures, Schottky barriers, work function, electric and thermal properties. Pp. 26-43

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