Engineering Physics Annotation << Back Prospects for Application of Electrical Low-Frequency Noise for Non-Destructive Testing of Semiconductor Devices Yakubovich B.I. Possibilities and prospects for using low-frequency electrical noise in non-destructive testing of semiconductor devices are considered. Low-frequency electrical noise in semiconductors and electronic devices based on them is typically determined by excess low-frequency noise dominating in low-frequency region. It is shown that excess noise associated with structural defects contains information about both the degree and rate of degradation of semiconductor devices. Assessing degree of degradation provides information about quality deficiencies of the manufactured device. Assessing degradation rate provides information about quality deficiencies of the device that arise during its operation. It is noted that degradation rate is a key characteristic determining duration of failure-free operation of the device. A method for determining degradation rate by measuring excess noise of semiconductor devices is proposed. The results demonstrate possibility of obtaining information about degree and rate of degradation of semiconductor devices by measuring the spectral characteristics of excess noise. The resulting set of information on degree and rate of degradation allows for a highly effective assessment of performance of semiconductor devices over a long period of operation. It is demonstrated that use of lowfrequency electrical noise offers potential to significantly improve non-destructive testing of semiconductorbased electronic devices. It is substantiated that use of low-frequency electrical noise for non-destructive testing is a promising approach to improving quality and reliability of semiconductor devices. Keywords: noise, fluctuations, electrical, semiconductor devices, non-destructive testing, reliability. DOI: 10.25791/infizik.7.2026.1569 Pp. 52-58.