Engineering Physics Annotation << Back Electrical Noise in Semiconductor Materials Yakubovich B.I. Electrical noise in semiconductor materials caused by capture and emission of charge carriers by traps formed by structural defects is considered. Rigorous quantitative description of the electrical noise in semiconductors caused by this reason is given. General expression for spectrum of electrical noise in semiconductors is calculated. Relationship between the properties of noise and the characteristics of semiconductors is determined. Types of dependences of noise intensity on the characteristics of semiconductors have been established. Expressions for noise spectrum are calculated in a number of specifi c cases. It is shown in which particular cases established general expression for spectrum of electrical noise in semiconductors transforms into previously known formulas. The results obtained show potential for reducing electrical noise in various types of semiconductor materials. The results of the article can be used to improve quality and reliability of semiconductor devices. Keywords: noise, fl uctuations, electrical, semiconductors, spectra, statistical. DOI: 10.25791/infizik.3.2024.1393 Pp. 29-35.